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Scientific Topics- Silicon material
(defects, impurities, carrier lifetime, doping type, mobility)
- Advanced characterization and simulation
(PL, EL, accurate measurement of back contact cells, carrier lifetime, surface recombination velocity, simulation tools, quality assurance, inline measurements, …) - Surface morphology and passivation
(texture, dielectric passivation layers, diffused layers, heterojunction passivation, optical performance, …) - Junction formation
(diffusion, amorphous hetero-junction, implantation, epitaxy, polysilicon, alloying, …) - Structuring and contact formation
(laser, inkjet, fine-line printing, plating, paste and ink development, Cu and barrier layers, …) - Process integration
(process sequences, production technology, process control, cost analysis, throughput, cell architecture, ...) - Module integration
(back-contact-cell modules, adhesive conductors, soldering, system aspects, reliability testing, cost analysis, …)
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